Showing results 5 to 6 of 6
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10 |
Pulse I-V characterization of a nanocrystalline oxide device with sub-gap density of states Kim, Taeho; Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.21, 2016-05 |
Discover