Showing results 1 to 1 of 1
Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion Kim, YH; Bae, SH; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.832 - 836, 2000-06 |
Discover