Showing results 4 to 7 of 7
Mechanical and Electrical Reliability Analysis of Flexible Si Complementary Metal-Oxide-Semiconductor Integrated Circuit Kim, Seungyoon; Kim, Cheolgyu; Bong, Jae Hoon; Hwang, Wan Sik; Kim, Taek-Soo; Oh, Jae Sub; Cho, Byung Jin, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.19, no.10, pp.6473 - 6480, 2019-10 |
Multi-Functional Universal Device using a Band-Engineered Vertical Structure Moon, Dong Il; Oh, Jae Sub; Choi, Sung Jin; Kim, Sungho; Kim, Jee Yeon; Kim, Moon Seok; Kim, Young Su; et al, 57th IEEE International Electron Device Meeting (IEDM), pp.551 - 554, IEEE, 2011-12-07 |
Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
Vacuum gate dielectric gate-all-around nanowire for hot carrier injection and bias temperature instability free transistor Han, Jin-Woo; Moon, Dong-Il; Oh, Jae Sub; Choi, Yang-Kyu; Meyyappan, M., APPLIED PHYSICS LETTERS, v.104, no.25, 2014-06 |
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