Browse "School of Electrical Engineering(전기및전자공학부)" by Author Park, Y.C.
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| Sub-5nm all-around gate FinFET for ultimate scaling Lee, H.; Yu, L.-E.; Ryu, S.-W.; Han, J.-W.; Jeon, K.; Jang, D.-Y.; Kim, K.-H.; et al, 2006 Symposium on VLSI Technology, VLSIT, pp.58 - 59, 2006-06-13 |
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