Browse "School of Electrical Engineering(전기및전자공학부)" by Author Baek, S.
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| Noise coupling to signal trace and via from power/ground simultaneous switching noise in high speed double data rates memory module Park, J.; Kim, H.; Pak, J.S.; Jeong, Y.; Baek, S.; Kim, Joungho; Lee, J.-J.; et al, 2004 International Symposium on Electromagnetic Compatibility, EMC 2004, pp.592 - 597, IEEE, 2004-08-09 |
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