Browse "School of Electrical Engineering(전기및전자공학부)" by Subject trapping set
Showing results 3 to 4 of 4
| Deep-Learning for Breaking the Trapping Sets in Low-Density Parity-Check Codes Han, Seokju; Oh, Jieun; Oh, Kyungmok; Ha, Jeongseok, IEEE TRANSACTIONS ON COMMUNICATIONS, v.70, no.5, pp.2909 - 2923, 2022-05 |
| 반복적 LDPC 복호과정에서의 Soft 정보 Correlation 현상 = Soft information correlation in iterative decoding of LDPC codeslink 최민석; Choi, Min-Seok; et al, 한국과학기술원, 2013 |
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