Showing results 2 to 5 of 5
Dislocation effects in FinFETs for different III-V compound semiconductors Hur, Ji-Hyun; Jeon, Sanghun, JOURNAL OF PHYSICS D-APPLIED PHYSICS, v.49, no.15, 2016-04 |
Dislocation scatterings in p-type Si1-xGex under weak electric field Hur, Ji-Hyun; Jeon, Sanghun, NANOTECHNOLOGY, v.26, no.49, 2015-12 |
Field-induced macroscopic barrier model for persistent photoconductivity in nanocrystalline oxide thin-film transistors Choi, Hyun-Sik; Jeon, Sanghun, APPLIED PHYSICS LETTERS, v.104, no.13, 2014-03 |
High-Field Electron Transport and High Saturation Velocity in Multilayer Indium Selenide Transistors Seok, Yongwook; Jang, Hanbyeol; Choi, Yitaek; Ko, Yeonghyeon; Kim, Minje; Im, Heungsoon; Watanabe, Kenji; et al, ACS NANO, v.18, no.11, pp.8099 - 8106, 2024-03 |
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