Showing results 2 to 8 of 8
Design of Sub-10-mu W Sub-0.1% THD Sinusoidal Current Generator IC for Bio-Impedance Sensing Kim, Kwantae; Kim, Sangyeob; Yoo, Hoi-Jun, IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.57, no.2, pp.586 - 595, 2022-02 |
Fast Optical Proximity Correction Using Graph Convolutional Network With Autoencoders Cho, Gangmin; Kim, Taeyoung; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.4, pp.629 - 635, 2023-11 |
Globally Optimal Inlier Set Maximization for Atlanta World Understanding Joo, Kyungdon; Oh, Tae-Hyun; Kweon, In-So; Bazin, Jean-Charles, IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, v.42, no.10, pp.2656 - 2669, 2020-10 |
Low Common-Mode Noise LLC Resonant Converter With Static-Point-Connected Transformer Kim, Keon-Woo; Jeong, Yeonho; Kim, Jae-Sang; Moon, Gun-Woo, IEEE TRANSACTIONS ON POWER ELECTRONICS, v.36, no.1, pp.401 - 408, 2021-01 |
Optical Proximity Correction Using Bidirectional Recurrent Neural Network With Attention Mechanism Kwon, Yonghwi; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.2, pp.168 - 176, 2021-05 |
SRAM-Based Computing-in-Memory Macro With Fully Parallel One-Step Multibit Computation Choi, Edward Jongyoon; Choi, Injun; Jeon, Chanhee; Yun, Gichan; Yi, Donghyeon; Ha, Sohmyung; Chang, Ik-Joon; et al, IEEE SOLID-STATE CIRCUITS LETTERS, v.5, pp.234 - 237, 2022 |
Synthesis of Lithography Test Patterns Using Machine Learning Model Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.1, pp.49 - 57, 2021-02 |
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