Showing results 5061 to 5080 of 14263
Effect of excitation point on surface phonon fields in phononic crystals in real- and k-space Otsuka, P. H.; Chinbe, R.; Tomoda, M.; Matsuda, O.; Veres, I. A.; Lee, J. -H.; Yoon, Jun-Bo; et al, JOURNAL OF APPLIED PHYSICS, v.117, no.24, 2015-06 |
Effect of Floating Gate Insertion on the Analog States of Ferroelectric Field-Effect Transistors Lee, Sangho; Lee, Youngkyu; Kim, Giuk; Kim, Taeho; Eom, Taehyong; Jung, Seong-Ook; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.70, no.1, pp.349 - 353, 2023-01 |
Effect of Forming Gas High-Pressure Annealing on Metal-Ferroelectric-Semiconductor Hafnia Ferroelectric Tunnel Junction Hwang, Junghyeon; Goh, Youngin; Jeon, Sanghun, IEEE ELECTRON DEVICE LETTERS, v.41, no.8, pp.1193 - 1196, 2020-08 |
Effect of Ga composition on mobility in a-InGaZnO thin-film transistors Ahn, Minho; Gaddam, Venkateswarlu; Park, Sungho; Jeon, Sanghun, NANOTECHNOLOGY, v.32, no.9, 2021-02 |
Effect of Generalized-K Fading on the Performance of Symmetric Coordinate Interleaved Orthogonal Designs Yoon, Chanho; Lee, Hoojin; Kang, Joonhyuk, IEEE COMMUNICATIONS LETTERS, v.18, no.4, pp.588 - 591, 2014-04 |
Effect of Gold Nanorods in an MgO Protective Layer of AC Plasma Display Panels Cho, Seok Ho; Lee, Seong-Min; Kim, Woo Hyun; Choi, Kyung-Cheol, ACS APPLIED MATERIALS INTERFACES, v.7, no.14, pp.7559 - 7565, 2015-04 |
Effect of helium addition on discharge characteristics in a flat fluorescent lamp Lee, SE; Lee, HN; Park, HB; Lee, KS; Choi, Kyung Cheol, JOURNAL OF APPLIED PHYSICS, v.98, pp.869 - 888, 2005-11 |
Effect of high pressure anneal on switching dynamics of ferroelectric hafnium zirconium oxide capacitors Buyantogtokh, Batzorig; Gaddam, Venkateswarlu; Jeon, Sanghun, JOURNAL OF APPLIED PHYSICS, v.129, no.24, 2021-06 |
Effect of Hydrogen Annealing on Contact Resistance Reduction of Metal-Interlayer-n-Germanium Source/Drain Structure Kim, Gwang-Sik; Yoo, Gwangwe; Seo, Yujin; Kim, Seung-Hwan; Cho, Karam; Cho, Byung-Jin; Shin, Changhwan; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.6, pp.709 - 712, 2016-06 |
Effect of hydrogen dilution on carrier transport in hydrogenated boron-doped nanocrystalline silicon-silicon carbide alloys Myong, SY; Lim, Koeng Su; Konagai, M, APPLIED PHYSICS LETTERS, v.88, pp.228 - 236, 2006-03 |
Effect of hydrogen on dynamic charge transport in amorphous oxide thin film transistors Kim, Taeho; Nam, Yunyong; Hur, Ji-Hyun; Park, Sang-Hee Ko; Jeon, Sanghun, NANOTECHNOLOGY, v.27, no.32, 2016-08 |
Effect of Hydrogen on Hafnium Zirconium Oxide Fabricated by Atomic Layer Deposition Using H2O2 Oxidant Kim, Hyoungkyu; Yun, Seokjung; Kim, Tae Ho; Kim, Hoon; Bae, Changdeuck; Jeon, Sanghun; Hong, Seungbum, PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, v.15, no.5, 2021-05 |
Effect of Insertion of Dielectric Layer on the Performance of Hafnia Ferroelectric Devices Hwang, Junghyeon; Goh, Youngin; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.2, pp.841 - 845, 2021-02 |
Effect of Laser-Induced Direct Micropatterning on Polymer Optoelectronic Devices Yun, Changhun; Han, Joo Won; Kang, Moon Hee; Kim, Yong Hyun; Kim, Bongjun; Yoo, Seunghyup, ACS APPLIED MATERIALS & INTERFACES, v.11, no.50, pp.47143 - 47152, 2019-12 |
Effect of LSP in Phosphor-Converted WLEDs by Application of Ag NPs With/Without Silica Shell Kim, Myeong-Cheol; Shin, Jeong Bin; Choi, Kyung Cheol, IEEE PHOTONICS TECHNOLOGY LETTERS, v.28, no.17, pp.1894 - 1897, 2016-09 |
Effect of Metal Nitride on Contact Resistivity of Metal-Interlayer-Ge Source/Drain in Sub-10-nm n-Type Ge FinFET Ahn, Juhan; Kim, Jeong-Kyu; Kim, Sun-Woo; Kim, Gwang-Sik; Shin, Changhwan; Kim, Jong-Kook; Cho, Byung-Jin; et al, IEEE ELECTRON DEVICE LETTERS, v.37, no.6, pp.705 - 708, 2016-06 |
Effect of Mutual Coupling on Uniform Circular Arrays With Vector Antenna Elements Jeon, Wonseok; Kim, Jin Hak; Chung, Sae-Young, IEEE ANTENNAS AND WIRELESS PROPAGATION LETTERS, v.16, pp.1703 - 1706, 2017-02 |
Effect of Noise Distribution in a WDM System Seeded by a Spectrum-Sliced ASE Moon, Sang-Rok; Yoo, Sang-Hwa; Lee, Chang-Hee, JOURNAL OF LIGHTWAVE TECHNOLOGY, v.32, no.12, pp.2271 - 2276, 2014-06 |
Effect of Off-state Stress on Gate-Induced Drain Leakage by Interface Traps in Buried-Gate FETs Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Hur, Jae; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.12, pp.5126 - 5132, 2019-11 |
Effect of oil on an electrowetting lenticular lens and related optical characteristics Shin, Dooseub; Kim, Junoh; Kim, Cheoljoong; Koo, Gyo Hyun; Sim, Jee Hoon; Lee, Junsik; Won, Yong Hyub, APPLIED OPTICS, v.56, no.7, pp.1886 - 1892, 2017-03 |
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