Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 32261 to 32280 of 51089

32261
Relay selection algorithm based on analytic hierarchy process = 계층분석법 기반의 릴레이 선택 알고리즘 연구link

Yoo, In-Chul; 유인철; et al, 한국과학기술원, 2013

32262
Relay selection and resource allocation in adaptive beamforming-based I2V communication system = 적응 빔포밍 기반 인프라-차량 통신 시스템에서 릴레이 선택 및 자원 할당link

Lee, Jae-Gwang; 이재광; et al, 한국과학기술원, 2011

32263
Relay selection and resource allocation in adaptive beamforming-based I2V communication system = 적응 빔포밍 기반 인프라-차량 통신 시스템에서 릴레이 선택 및 자원 할당link

Lee, Jae-Gwang; 이재광; et al, 한국과학기술원, 2011

32264
Relevant modulation schemes combined with coding proposed for indoor wireless infrared communication systems

Dzung, H.-Q.; Dong, S.; Lee, Man Seop, Proceedings of the International Conference on Telecommunications 2002, v.2, pp.425 - 429, 2002-06-23

32265
Reliability analysis and design of real-time fault tolerant control systems under transient faults = 과도 고장하의 실시간 내고장성 제어시스템의 신뢰도 해석 및 설계link

Kwak, Seong-Woo; 곽성우; et al, 한국과학기술원, 2000

32266
Reliability analysis of real-time controllers with dual-modular temporal redundancy

Kim, Byung Kook, RTCSA '99, pp.364 - 371, IEEE, 1999-12

32267
Reliability analysis of real-time fault-tolerant control systems with dual-modular temporal redundancy = 모듈 및 시간 여유를 이용한 실시간 내고장성 제어 시스템의 신뢰도 해석link

Kim, Jae-Kwon; 김재권; et al, 한국과학기술원, 2003

32268
Reliability and Performance Analysis of Satellite On-board Time-Space-Time Switching Networks with Multiple Separated Space Switches

Sung, Dan Keun; Kang, SH, Joint Conference on Communications, Networks, Switching Systems and Satellite Communications, pp.232 - 236, 1993

32269
Reliability and Performance Analysis of Time-Space-Time Swiching Networks with Multiple Separated Space Switches

Sung, Dan Keun; Kang, SH, International Teletraffic Congress, pp.111 - 116, 1991

32270
Reliability and performance analysis of time-space-time switching networks with multiple separated space switches

Sung, Dan Keun; Kang, Sang H, QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, v.8, no.4, pp.335 - 340, 1992-07

32271
Reliability and Security in the CoDeeN Content Distribution Network

Park, KyoungSoo, USENIX Annual Technical Conference (USENIX ATC), USENIX, 2004-06-29

32272
Reliability improvement of a flexible FD-SOI MOSFET via heat management

Bong, Jae Hoon; Kim, Seung-Yoon; Jeong, Chan Bae; Chang, Ki Soo; Hwang, Wan Sik; Cho, Byung Jin, APPLIED PHYSICS LETTERS, v.110, no.25, 2017-06

32273
Reliability Improvement of Charge Trap Flash Memory Cell with Sealing Oxide in Fluorine Incorporation

이승환; 이태윤; 안현준; 이태인; 신의중; 신성원; 조병진, 제26회 한국반도체학술대회, DB하이텍, 한국반도체산업협회, 한국반도체연구조합, 2019-02-14

32274
Reliability improvement of embedded real-time systems using time redundancy = 시간 여유를 이용한 내장형 실시간 시스템의 신뢰도 향상에 관한 연구link

Ryu, Sang-Moon; 유상문; et al, 한국과학기술원, 2006

32275
Reliability Improvement of Gate-All-Around Junctionless SONOS Memory by Joule Heat From Inherent Nanowire Current

Lee, Jung-Woo; Han, Joon-Kyu; Kim, Myung-Su; Yu, Ji-Man; Jung, Jin-Woo; Yun, Seong-Yun; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.11, pp.6133 - 6138, 2022-11

32276
Reliability Improvement of Gate-All-Around SONOS Memory by Joule Heat From Gate-Induced Drain Leakage Current

Lee, Jung-Woo; Han, Joon-Kyu; Yu, Ji-Man; Lee, Geon-Beom; Tcho, Il-Woong; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.69, no.1, pp.115 - 119, 2022-01

32277
Reliability improvements of SS7 signaling protocol architecture using ATM technology

Lee, SungWon; Song, Young-Jae; Cho, Dong-Ho, IEEE International Conference on Communications, ICC 1998, pp.1415 - 1419, IEEE, 1998-06

32278
Reliability issue related to dielectric charging in Capacitive Micromachined Ultrasonic Transducers: a review

Munir, Junaid; Ain, Quratul; Lee, Hyunjoo Jenny, MICROELECTRONICS RELIABILITY, v.92, pp.155 - 167, 2019-01

32279
Reliability issues in multi-gate FinFETs

Choi, Yang-Kyu; Han, J.-W.; Lee, H., ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, pp.1101 - 1104, 2006-10-23

32280
Reliability of Barrier Ribs in a Flexible Photoluminescent Display

Choi, Kyung Cheol; Jang, C; Kim, SH; Kim, KJ; Ahn, SI, Material Research Society, 2009-11-30

Discover

Type

Open Access

Date issued

. next

Subject

rss_1.0 rss_2.0 atom_1.0