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Improvement of catastrophic optical damage (COD) level for high-power 0.98-mu m GaInAs-GaInP laser diodes using impurity induced layer disordering Lee, JK; Park, KH; Jang, DH; Cho, HS; Park, Chul Soon; Pyun, KE; Jeong, J, IEEE PHOTONICS TECHNOLOGY LETTERS, v.10, no.9, pp.1226 - 1228, 1998-09 |
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