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Body thickness dependence of impact ionization in a multiple-gate FinFET Han, Jin-Woo; Lee, Jiye; Park, Donggun; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.28, no.7, pp.625 - 627, 2007-07 |
Three-Dimensional Fin-Structured Semiconducting Carbon Nanotube Network Transistor Lee, Dong-Il; Lee, Byung-Hyun; Yoon, Jinsu; Ahn, Dae-Chul; Park, Jun-Young; Hur, Jae; Kim, Myung-Su; et al, ACS NANO, v.10, no.12, pp.10894 - 10900, 2016-12 |
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