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Leakage current limit of time domain reflectometry in ultrathin dielectric characterization Kim, Yonghun; Baek, Seung Heon; Jeon, Chang Hoon; Lee, Young Gon; Kim, Jin Ju; Jung, Ukjin; Kang, Soo Cheol; et al, JAPANESE JOURNAL OF APPLIED PHYSICS, v.53, no.8, pp.37 - 41, 2014-08 |
Study on spin-orbit torque based non-volatile logic-in-memory applications = 스핀-오빗 토크 기반의 비휘발성 로직 소자 개발에 대한 연구link Baek, Seung Heon; 백승헌; Shin, Min Cheol; 신민철; et al, 한국과학기술원, 2017 |
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