Browse "School of Electrical Engineering(전기및전자공학부)" by Subject Disturbance
Showing results 1 to 4 of 4
| Gate-Induced Drain-Leakage (GIDL) Programming Method for Soft-Programming-Free Operation in Unified RAM (URAM) Han, Jin-Woo; Ryu, Seong-Wan; Choi, Sung-Jin; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.2, pp.189 - 191, 2009-02 |
| Gate-to-Source/Drain Non-Overlap Device for Soft-Program Immune Unified-RAM (URAM) Han, Jin-Woo; Kim, Chung-Jin; Choi, Sung-Jin; Kim, Dong-Hyun; Moon, Dong-Il; Choi, Yang-Kyu, IEEE Electron Device Letters, Vol. 30, No. 5, pp.544-546, 2009-05 |
| Gate-to-Source/Drain Nonoverlap Device for Soft-Program Immune Unified RAM (URAM) Han, Jin-Woo; Kim, Chung-Jin; Choi, Sung-Jin; Kim, Dong-Hyun; Moon, Dong-Il; Choi, Yang-Kyu, IEEE ELECTRON DEVICE LETTERS, v.30, no.5, pp.544 - 546, 2009-05 |
| 영구자석형 동기전동기의 전류제어에서 외란관측기를 사용한 데드 타임 보상기법 = Dead time compensation method using disturbance observer in current control of PMSMlink 정태인; Jung, Tae-In; et al, 한국과학기술원, 2000 |
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