Browse "School of Electrical Engineering(전기및전자공학부)" by Title 

Showing results 33161 to 33180 of 51120

33161
Saliency detection via textural contrast

Kim, Won-Jun; Kim, Chang-Ick, Optics Letters, v.37, no.9, pp.1550 - 1552, 2012-05

33162
Saliency detection: A self-ordinal resemblance approach

Kim, W; Jung, C; Kim, Changick, 2010 IEEE International Conference on Multimedia and Expo, ICME 2010, pp.1260 - 1265, IEEE, 2010-07-19

33163
Saliency Refinement: Towards a Uniformly Highlighted Salient Object

Eun, Hyunjun; Kim, Yoonhyung; Jung, Chanho; Kim, Chang-Ick, SIGNAL PROCESSING-IMAGE COMMUNICATION, v.62, pp.16 - 32, 2018-03

33164
Salient object detection using bipartite dictionary

Seo, Yuna; Lee, Donghoon; Yoo, Chang Dong, IEEE International Conference on Image Processing, pp.1145 - 1149, IEEE Signal Processing Society, 2014-10-27

33165
Salient object detection using bipartite dictionary = 이분 딕셔너리를 이용한 중요 객체 검출link

Seo, Yu-Na; 서유나; et al, 한국과학기술원, 2014

33166
Salient Object Detection Using HOS Based L-0 Smoothing and Shape-Aware Region Merging

Eun, Hyun Jun; Kim, Jong Hee; Kim, Chang Ick, Visual Communications and Image Processing, IEEE, 2015-12-14

33167
Salient object detection using HOS based L0 smoothing and shape-aware region merging = HOS 기반 L0 평활화와 형태인식 영역 병합을 이용한 돌출 객체 검출link

Eun, Hyunjun; 은현준; et al, 한국과학기술원, 2015

33168
Salient region detection using a discriminative color transform dictionary = 차별적 색상 변환 사전을 이용한 관심 영역 검출link

Kim, Jiwhan; 김지환; et al, 한국과학기술원, 2013

33169
Salient Region Detection via High-Dimensional Color Transform

Kim, Jiwhan; Han, Dongyoon; Tai, Yu-Wing; Kim, Junmo, CVPR 2014 IEEE Conference on Computer Vision and Pattern Recognition, IEEE Computer Society and the Computer Vision Foundation (CVF), 2014-06-24

33170
Salient Region Detection via High-Dimensional Color Transform and Local Spatial Support

Kim, Jiwhan; Han, Dongyoon; Tai, Yu-Wing; Kim, Junmo, IEEE TRANSACTIONS ON IMAGE PROCESSING, v.25, no.1, pp.9 - 23, 2016-01

33171
Salient View Selection for Visual Recognition of Industrial Components

Kim, Seong-heum; Choe, Gyeongmin; Park, Min-Gyu; Kweon, In So, IEEE ROBOTICS AND AUTOMATION LETTERS, v.5, no.2, pp.2506 - 2513, 2020-04

33172
Salient View Selection for Visual Recognition of Industrial Components

Kim, Seoung-Heum; Choe, Gyeongmin; Park, Min-Gyu; Kweon, In-So, IEEE International Conference on Robotics and Automation, IEEE International Conference on Robotics and Automation, 2020-05

33173
Sample Selection for Fair and Robust Training

Roh, Yuji; Whang, Steven Euijong; Lee, Kangwook; Suh, Changho, 35th Conference on Neural Information Processing Systems (NeurIPS 2021), NeurIPS, 2021-12-09

33174
Sample-efficient and safe deep reinforcement learning via reset deep ensemble agents

Kim, Woojun; Shin, Yongjae; Park, Jongeui; Sung, Youngchul, Thirty-seventh Conference on Neural Information Processing Systems (NeurIPS) 2023, Neural Information Processing Systems, 2023-12

33175
Sample-efficient deep reinforcement learning via episodic backward update = 에피소드 후향 업데이트를 통한 효율적인 심층강화학습link

Lee, Su Young; Chung, Sae-Young; et al, 한국과학기술원, 2019

33176
Sample-efficient deep reinforcement learning via episodic backward update

Lee, SuYoung; Choi, Sungik; Chung, Sae-Young, 33rd Annual Conference on Neural Information Processing Systems, NeurIPS 2019, Neural information processing systems foundation, 2019-12

33177
Sample-efficient Reinforcement Learning Representation Learning with Curiosity Contrastive Forward Dynamics Model

Nguyen, Thanh; Luu, Tung M.; Vu, Thang; Yoo, Chang-Dong, 2021 IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2021, pp.3471 - 3477, IEEE, 2021-09-27

33178
SAMPLING CORRELATION SOURCES FOR TIMING YIELD ANALYSIS OF SEQUENTIAL CIRCUITS WITH CLOCK NETWORKS

Yu, Lee-Eun; Shin, Chang-Sik; Paik, Seung-Whun; Liou, Jing-Jia; Shin, Young-Soo, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, v.20, no.8, pp.1547 - 1569, 2011-12

33179
Sampling effect in continuous-time small-signal modelling of average-current mode control

Jung, YS; Youn, Myung Joong, IEE PROCEEDINGS-ELECTRIC POWER APPLICATIONS, v.149, no.4, pp.311 - 316, 2002-07

33180
Sampling Race: Bypassing Timing-based Analog Active Sensor Spoofing Detection on Analog-digital Systems

Shin, Hocheol; Son, Yunmok; Park, Youngseok; Kwon, Yujin; Kim, Yongdae, 10th USENIX Workshop on Offensive Technologies, USENIX, 2016-08-09

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