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Physically Unclonable Function With a Rough Silicon Channel MOSFET Jung, Dae-Han; Yu, Ji-Man; Ku, Ja-Yun; Yoon, Sung-Su; Kim, Jae-Hun; Han, Joon-Kyu; Kil, Tae-Hyun; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.1, pp.425 - 430, 2024-01 |
Stable Ferroelectric Poly(Vinylidene Fluoride-Trifluoroethylene) Film for Flexible Nonvolatile Memory Application Kim, Woo-Young; Lee, Hee-Chul, IEEE ELECTRON DEVICE LETTERS, v.33, no.2, pp.260 - 262, 2012-02 |
Surface-Roughness-Limited Mean Free Path in Silicon Nanowire Field Effect Transistors Jung, Hyo-Eun; Shin, Mincheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.60, no.6, pp.1861 - 1866, 2013-06 |
Theoretical study of the surface roughness scattering effects on silicon nanowire FETs = 실리콘 나노와이어 트랜지스터에서의 표면 거칠기 충돌영향에 대한 이론연구link Jung, Hyo-Eun; 정효은; et al, 한국과학기술원, 2013 |
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