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Characterization of vacuum evaporated polycrystalline Cd0.96Zn0.04Te thin films by XRD, Raman scattering and spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, CRYSTAL RESEARCH AND TECHNOLOGY, v.37, no.9, pp.964 - 975, 2002 |
Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08 |
Temperature measurement of Joule heated silicon micro/nanowires using selectively decorated quantum dots Yun, Jeonghoon; Ahn, Jae-Hyuk; Lee, Bong Jae; Moon, Dong-Il; Choi, Yang-Kyu; Park, Inkyu, NANOTECHNOLOGY, v.27, no.50, 2016-12 |
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