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Raman scattering studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1479 - 1482, 2005-06 |
Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Rodriguez-Viejo, J; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790, 2004-03 |
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