Showing results 1 to 6 of 6
Controlling the infrared optical properties of rf-sputtered NiO films for applications of infrared window Shim, Hyun Bin; Kang, In-Ku; Jeon, Gwang-Jae; Kim, Woo Young; Lee, Hee Chul, INFRARED PHYSICS & TECHNOLOGY, v.72, pp.135 - 139, 2015-09 |
Enhanced bolometric properties of nickel oxide thin films for infrared image sensor applications by substitutional incorporation of Li Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.44, no.7, pp.7808 - 7813, 2018-05 |
Microstructural Effects on Nickel Oxide Film Properties in an Infrared Electrochromic Window for Shutter-Less Infrared Sensor Application Shim, Hyun Bin; Kim, Woo Young; Kang, In-Ku; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.20, pp.6522 - 6528, 2017-10 |
Sputtering pressure dependent bolometric properties of Ni1-xO thin films for uncooled bolometer applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Kim, Woo Young; Lee, Hee Chul, CERAMICS INTERNATIONAL, v.43, no.12, pp.9498 - 9504, 2017-08 |
Systematic Investigation on Deposition Temperature Effect of Ni1-xO Thin Films for Uncooled Infrared Image Sensor Applications Kang, In-Ku; Reddy, Y. Ashok Kumar; Shin, Young Bong; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.15, no.12, pp.7234 - 7241, 2015-12 |
The bolometric characteristic of thermally oxidized thin nickel film for an uncooled infrared image sensor Kim, Dong-Soo; Kwon, Il-Woong; Lee, Yong-Soo; Lee, Hee-Chul, INFRARED PHYSICS TECHNOLOGY, v.54, no.1, pp.10 - 12, 2011-01 |
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