Bias stress effect in graphene field-effect transistors based on passivation layer
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Hamin | ko |
| dc.contributor.author | Park, Ick-Joon | ko |
| dc.contributor.author | Ha, Young-Wook | ko |
| dc.contributor.author | Choi, Sung-Yool | ko |
| dc.date.accessioned | 2015-07-21T04:09:43Z | - |
| dc.date.available | 2015-07-21T04:09:43Z | - |
| dc.date.created | 2015-06-30 | - |
| dc.date.created | 2015-06-30 | - |
| dc.date.issued | 2015-07-03 | - |
| dc.identifier.citation | NANO KOREA 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/199649 | - |
| dc.language | English | - |
| dc.publisher | 나노기술연구협의회 | - |
| dc.title | Bias stress effect in graphene field-effect transistors based on passivation layer | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | NANO KOREA 2015 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 서울(Coex) | - |
| dc.contributor.localauthor | Choi, Sung-Yool | - |
| dc.contributor.nonIdAuthor | Park, Hamin | - |
| dc.contributor.nonIdAuthor | Park, Ick-Joon | - |
| dc.contributor.nonIdAuthor | Ha, Young-Wook | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.