NMR spin-lattice relaxation time T-1 of thin films obtained by magnetic resonance force microscopy

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We obtained the NMR spectrum and the spin-lattice relaxation time (T-1) for thin film samples by magnetic resonance force microscopy (MRFM). The samples were CaF2 thin films which were 50 nm and 150 nm thick. T-1 was measured at 18 K using a cyclic adiabatic inversion method at a fixed frequency. A comparison of the bulk and two thin films showed that T-1 becomes shorter as the film thickness decreases. To make the comparison as accurate as possible, all three samples were loaded onto different beams of a multi-cantilever array and measured in the same experimental environment.
Publisher
ACADEMIC PRESS INC ELSEVIER SCIENCE
Issue Date
2015-05
Language
English
Article Type
Article
Citation

JOURNAL OF MAGNETIC RESONANCE, v.254, pp.71 - 74

ISSN
1090-7807
DOI
10.1016/j.jmr.2015.02.009
URI
http://hdl.handle.net/10203/199466
Appears in Collection
PH-Journal Papers(저널논문)
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