Analysis of GaN-based light-emitting diodes using near-field scanning optical microscopy in various modes
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김민관 | ko |
| dc.contributor.author | 조용훈 | ko |
| dc.contributor.author | 박충현 | ko |
| dc.date.accessioned | 2015-06-29T04:35:45Z | - |
| dc.date.available | 2015-06-29T04:35:45Z | - |
| dc.date.created | 2015-06-25 | - |
| dc.date.issued | 2015-02-12 | - |
| dc.identifier.citation | 제22회 한국반도체학술대회 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/199438 | - |
| dc.language | English | - |
| dc.publisher | 한국반도체연구조합 | - |
| dc.title | Analysis of GaN-based light-emitting diodes using near-field scanning optical microscopy in various modes | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | 제22회 한국반도체학술대회 | - |
| dc.identifier.conferencecountry | KO | - |
| dc.identifier.conferencelocation | 인천 송도컨벤시아 | - |
| dc.contributor.localauthor | 조용훈 | - |
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