Large step-phase measurement by a reduced-phase triple-illumination interferometer

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dc.contributor.authorTayebi, Behnamko
dc.contributor.authorJafarfard, Mohammad Rezako
dc.contributor.authorSharif, Farnazko
dc.contributor.authorSong, Young Sikko
dc.contributor.authorHar, Dongsooko
dc.contributor.authorKim, Dug Youngko
dc.date.accessioned2015-06-25T06:27:27Z-
dc.date.available2015-06-25T06:27:27Z-
dc.date.created2015-05-29-
dc.date.created2015-05-29-
dc.date.issued2015-05-
dc.identifier.citationOPTICS EXPRESS, v.23, no.9, pp.11264 - 11271-
dc.identifier.issn1094-4087-
dc.identifier.urihttp://hdl.handle.net/10203/199066-
dc.description.abstractWe present a reduced-phase triple-illumination interferometer (RPTII) as a novel single-shot technique to increase the precision of dual-illumination optical phase unwrapping techniques. The technique employs two measurement ranges to record both low-precision unwrapped and high-precision wrapped phases. To unwrap the high-precision phase, a hierarchical optical phase unwrapping algorithm is used with the low-precision unwrapped phase. The feasibility of this technique is demonstrated by measuring a stepped object with a height 2100 times greater than the wavelength of the source. The phase is reconstructed without applying any numerical unwrapping algorithms, and its noise level is decreased by a factor of ten. (C)2015 Optical Society of America-
dc.languageEnglish-
dc.publisherOPTICAL SOC AMER-
dc.subjectDIGITAL HOLOGRAPHIC MICROSCOPY-
dc.subjectIMAGE-RECONSTRUCTION-
dc.subjectSHAPE MEASUREMENT-
dc.subjectREFRACTIVE-INDEX-
dc.subjectSPECKLE-NOISE-
dc.subjectLATERAL-SHEAR-
dc.subjectWAVELENGTH-
dc.subjectOBJECTS-
dc.subjectREDUCTION-
dc.subjectTHICKNESS-
dc.titleLarge step-phase measurement by a reduced-phase triple-illumination interferometer-
dc.typeArticle-
dc.identifier.wosid000354337700039-
dc.identifier.scopusid2-s2.0-84943381419-
dc.type.rimsART-
dc.citation.volume23-
dc.citation.issue9-
dc.citation.beginningpage11264-
dc.citation.endingpage11271-
dc.citation.publicationnameOPTICS EXPRESS-
dc.identifier.doi10.1364/OE.23.011264-
dc.contributor.localauthorHar, Dongsoo-
dc.contributor.nonIdAuthorTayebi, Behnam-
dc.contributor.nonIdAuthorJafarfard, Mohammad Reza-
dc.contributor.nonIdAuthorSharif, Farnaz-
dc.contributor.nonIdAuthorSong, Young Sik-
dc.contributor.nonIdAuthorKim, Dug Young-
dc.description.isOpenAccessY-
dc.type.journalArticleArticle-
dc.subject.keywordPlusDIGITAL HOLOGRAPHIC MICROSCOPY-
dc.subject.keywordPlusIMAGE-RECONSTRUCTION-
dc.subject.keywordPlusSHAPE MEASUREMENT-
dc.subject.keywordPlusREFRACTIVE-INDEX-
dc.subject.keywordPlusSPECKLE-NOISE-
dc.subject.keywordPlusLATERAL-SHEAR-
dc.subject.keywordPlusWAVELENGTH-
dc.subject.keywordPlusOBJECTS-
dc.subject.keywordPlusREDUCTION-
dc.subject.keywordPlusTHICKNESS-
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