DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tayebi, Behnam | ko |
dc.contributor.author | Jafarfard, Mohammad Reza | ko |
dc.contributor.author | Sharif, Farnaz | ko |
dc.contributor.author | Song, Young Sik | ko |
dc.contributor.author | Har, Dongsoo | ko |
dc.contributor.author | Kim, Dug Young | ko |
dc.date.accessioned | 2015-06-25T06:27:27Z | - |
dc.date.available | 2015-06-25T06:27:27Z | - |
dc.date.created | 2015-05-29 | - |
dc.date.created | 2015-05-29 | - |
dc.date.issued | 2015-05 | - |
dc.identifier.citation | OPTICS EXPRESS, v.23, no.9, pp.11264 - 11271 | - |
dc.identifier.issn | 1094-4087 | - |
dc.identifier.uri | http://hdl.handle.net/10203/199066 | - |
dc.description.abstract | We present a reduced-phase triple-illumination interferometer (RPTII) as a novel single-shot technique to increase the precision of dual-illumination optical phase unwrapping techniques. The technique employs two measurement ranges to record both low-precision unwrapped and high-precision wrapped phases. To unwrap the high-precision phase, a hierarchical optical phase unwrapping algorithm is used with the low-precision unwrapped phase. The feasibility of this technique is demonstrated by measuring a stepped object with a height 2100 times greater than the wavelength of the source. The phase is reconstructed without applying any numerical unwrapping algorithms, and its noise level is decreased by a factor of ten. (C)2015 Optical Society of America | - |
dc.language | English | - |
dc.publisher | OPTICAL SOC AMER | - |
dc.subject | DIGITAL HOLOGRAPHIC MICROSCOPY | - |
dc.subject | IMAGE-RECONSTRUCTION | - |
dc.subject | SHAPE MEASUREMENT | - |
dc.subject | REFRACTIVE-INDEX | - |
dc.subject | SPECKLE-NOISE | - |
dc.subject | LATERAL-SHEAR | - |
dc.subject | WAVELENGTH | - |
dc.subject | OBJECTS | - |
dc.subject | REDUCTION | - |
dc.subject | THICKNESS | - |
dc.title | Large step-phase measurement by a reduced-phase triple-illumination interferometer | - |
dc.type | Article | - |
dc.identifier.wosid | 000354337700039 | - |
dc.identifier.scopusid | 2-s2.0-84943381419 | - |
dc.type.rims | ART | - |
dc.citation.volume | 23 | - |
dc.citation.issue | 9 | - |
dc.citation.beginningpage | 11264 | - |
dc.citation.endingpage | 11271 | - |
dc.citation.publicationname | OPTICS EXPRESS | - |
dc.identifier.doi | 10.1364/OE.23.011264 | - |
dc.contributor.localauthor | Har, Dongsoo | - |
dc.contributor.nonIdAuthor | Tayebi, Behnam | - |
dc.contributor.nonIdAuthor | Jafarfard, Mohammad Reza | - |
dc.contributor.nonIdAuthor | Sharif, Farnaz | - |
dc.contributor.nonIdAuthor | Song, Young Sik | - |
dc.contributor.nonIdAuthor | Kim, Dug Young | - |
dc.description.isOpenAccess | Y | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordPlus | DIGITAL HOLOGRAPHIC MICROSCOPY | - |
dc.subject.keywordPlus | IMAGE-RECONSTRUCTION | - |
dc.subject.keywordPlus | SHAPE MEASUREMENT | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | SPECKLE-NOISE | - |
dc.subject.keywordPlus | LATERAL-SHEAR | - |
dc.subject.keywordPlus | WAVELENGTH | - |
dc.subject.keywordPlus | OBJECTS | - |
dc.subject.keywordPlus | REDUCTION | - |
dc.subject.keywordPlus | THICKNESS | - |
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