Bottom-inlet-type micro-electro-mechanical system acoustic sensors based on two polyimide/amorphous-Si sacrificial layers

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dc.contributor.authorLee, Jaewooko
dc.contributor.authorJe, Changhanko
dc.contributor.authorKim, Yi-Gyeongko
dc.contributor.authorLee, Sung Q.ko
dc.contributor.authorYang, Woo-Seokko
dc.contributor.authorLee, Sang-Gugko
dc.date.accessioned2015-05-22T02:11:49Z-
dc.date.available2015-05-22T02:11:49Z-
dc.date.created2015-01-27-
dc.date.created2015-01-27-
dc.date.created2015-01-27-
dc.date.issued2014-12-
dc.identifier.citationMICRO & NANO LETTERS, v.9, no.12, pp.845 - 849-
dc.identifier.issn1750-0443-
dc.identifier.urihttp://hdl.handle.net/10203/198518-
dc.description.abstractA bottom-inlet-type micro-electro-mechanical system acoustic sensor based on two polyimide/a-Si sacrificial layers is presented. A diaphragm was adapted to be on the top side of the sacrificial layers, showing the bottom-inlet structure for the package, which has the sensitivity of more than 3 dB compared with that of the top-inlet type. Also, the fundamental CMOS process implemented with Al electrodes was applied to have simple releasing steps by O-2 ashing and XeF2 isotropic etching because of their material etching selectivity. The sensor module had a sensitivity of -38.9 dBV/Pa at 1 kHz with a bias of 9.2 V in the sweep range from 100 Hz to 16 kHz. In addition, to evaluate the open-circuit sensitivity, structure-based equivalent circuit modelling was performed with lumped parameters. The modelled sensitivity was in good agreement with the measured sensitivity in the error rate of 4.3% under 8 kHz, demonstrating the validity of the modelling. The modelled open-circuit sensitivity was determined to be -37.2 dBV/Pa at 1 kHz using the proposed lumped model.-
dc.languageEnglish-
dc.publisherINST ENGINEERING TECHNOLOGY-IET-
dc.titleBottom-inlet-type micro-electro-mechanical system acoustic sensors based on two polyimide/amorphous-Si sacrificial layers-
dc.typeArticle-
dc.identifier.wosid000346637200005-
dc.identifier.scopusid2-s2.0-84928234974-
dc.type.rimsART-
dc.citation.volume9-
dc.citation.issue12-
dc.citation.beginningpage845-
dc.citation.endingpage849-
dc.citation.publicationnameMICRO & NANO LETTERS-
dc.identifier.doi10.1049/mnl.2014.0381-
dc.contributor.localauthorLee, Sang-Gug-
dc.contributor.nonIdAuthorJe, Changhan-
dc.contributor.nonIdAuthorKim, Yi-Gyeong-
dc.contributor.nonIdAuthorLee, Sung Q.-
dc.contributor.nonIdAuthorYang, Woo-Seok-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
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