Investigation of bias-stress-induced instability in graphene field-effect transistor using new polymer-free transfer method
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Hamin | ko |
| dc.contributor.author | Park, Ick-Joon | ko |
| dc.contributor.author | Choi, Sung-Yool | ko |
| dc.date.accessioned | 2015-04-07T01:17:38Z | - |
| dc.date.available | 2015-04-07T01:17:38Z | - |
| dc.date.created | 2015-02-04 | - |
| dc.date.created | 2015-02-04 | - |
| dc.date.issued | 2015-01-28 | - |
| dc.identifier.citation | ICEIC 2015 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/194899 | - |
| dc.language | English | - |
| dc.publisher | ICEIC 2015(International Conference on Electronics, Information and Communication) | - |
| dc.title | Investigation of bias-stress-induced instability in graphene field-effect transistor using new polymer-free transfer method | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | ICEIC 2015 | - |
| dc.identifier.conferencecountry | SI | - |
| dc.identifier.conferencelocation | Grand Hyatt Singapore | - |
| dc.contributor.localauthor | Choi, Sung-Yool | - |
| dc.contributor.nonIdAuthor | Park, Hamin | - |
| dc.contributor.nonIdAuthor | Park, Ick-Joon | - |
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