DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Byung-Hyun | - |
dc.contributor.author | Kim, Seungchul | - |
dc.contributor.author | Jung, Hyo Eun | - |
dc.contributor.author | Chung, YongChae | - |
dc.contributor.author | Shin, Min-Cheol | - |
dc.contributor.author | Lee, Kwang-Ryeol | - |
dc.date.accessioned | 2015-03-30T01:29:02Z | - |
dc.date.available | 2015-03-30T01:29:02Z | - |
dc.date.created | 2015-01-16 | - |
dc.date.issued | 2015-01-09 | - |
dc.identifier.citation | The 9th International Conference on Computational Physcics, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/194567 | - |
dc.language | ENG | - |
dc.publisher | ICCP-9 | - |
dc.title | Multi-scale Approach for Roughness Effect of Si-SiO2 Nanowire Interface on Electronic Transport | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The 9th International Conference on Computational Physcics | - |
dc.identifier.conferencecountry | Singapore | - |
dc.contributor.localauthor | Jung, Hyo Eun | - |
dc.contributor.localauthor | Shin, Min-Cheol | - |
dc.contributor.nonIdAuthor | Kim, Byung-Hyun | - |
dc.contributor.nonIdAuthor | Kim, Seungchul | - |
dc.contributor.nonIdAuthor | Chung, YongChae | - |
dc.contributor.nonIdAuthor | Lee, Kwang-Ryeol | - |
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