DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Sung-Chul | - |
dc.contributor.author | Palumbo, Anthony C. | - |
dc.date.accessioned | 2010-09-10T05:17:56Z | - |
dc.date.available | 2010-09-10T05:17:56Z | - |
dc.date.issued | 1990-01-01 | - |
dc.identifier.citation | Journal of Applied Physics, Volume 67, Issue 1, 317-320 | en |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/10203/19433 | - |
dc.description.abstract | We present the remnant polar Kerr rotation and ellipticity for a Co/Pd superlattice. The magneto‐optical properties of Co/Pd superlattice thin films have been investigated by measuring both the polar Kerr and ellipticity hysteresis loops at a wavelength of 780 nm. It was found that the remnant Kerr rotation was strongly dependent on the thickness of Co and Pd sublayers as well as the total film thickness. In this system, the maximum polar Kerr rotation of 0.43° was observed at the film thickness of 110 Å, where each bilayer was composed of 2‐Å‐thick Co and 9‐Å‐thick Pd sublayers. | en |
dc.language.iso | en_US | en |
dc.publisher | American Institute of Physics | en |
dc.subject | cobalt | en |
dc.subject | palladium | en |
dc.subject | superlattices | en |
dc.subject | thin films | en |
dc.subject | magneto-optical effects | en |
dc.subject | kerr effect | en |
dc.subject | ellipsometry | en |
dc.subject | hysteresis | en |
dc.title | Magneto‐optical properties of Co/Pd superlattice thin films | en |
dc.type | Article | en |
dc.identifier.doi | 10.1063/1.345255 | - |
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