DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chang, Kee-Joo | ko |
dc.contributor.author | Oh, Young-Jun | ko |
dc.contributor.author | Lee, Chang Hwi | ko |
dc.date.accessioned | 2015-03-27T05:26:21Z | - |
dc.date.available | 2015-03-27T05:26:21Z | - |
dc.date.created | 2015-01-06 | - |
dc.date.created | 2015-01-06 | - |
dc.date.issued | 2014-12-10 | - |
dc.identifier.citation | The 17th International Symposium Physics of semiconductors and Applications | - |
dc.identifier.uri | http://hdl.handle.net/10203/194229 | - |
dc.language | English | - |
dc.publisher | ISPSA | - |
dc.title | Migration Pathways and Barrier for B diffusion in SiO2 and SiGe/SiO2 interfaces | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The 17th International Symposium Physics of semiconductors and Applications | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Ramada Plaza Jeju, Jeju Island | - |
dc.contributor.localauthor | Chang, Kee-Joo | - |
dc.contributor.nonIdAuthor | Lee, Chang Hwi | - |
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