Temperature aspect of degradation of electrochemical double-layer capacitors (EDLC)

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dc.contributor.authorLee, Soon-Bokko
dc.contributor.authorBaek, D.C.ko
dc.contributor.authorKim, H.H.ko
dc.date.accessioned2015-01-29T05:20:47Z-
dc.date.available2015-01-29T05:20:47Z-
dc.date.created2014-12-24-
dc.date.created2014-12-24-
dc.date.issued2014-11-17-
dc.identifier.citationInternational Conference on Experimental Mechanics 2014-
dc.identifier.urihttp://hdl.handle.net/10203/193365-
dc.languageEnglish-
dc.publisherInternational Conference on Experimental Mechanics 2014-
dc.titleTemperature aspect of degradation of electrochemical double-layer capacitors (EDLC)-
dc.typeConference-
dc.identifier.wosid000353122200026-
dc.identifier.scopusid2-s2.0-84924943129-
dc.type.rimsCONF-
dc.citation.publicationnameInternational Conference on Experimental Mechanics 2014-
dc.identifier.conferencecountrySI-
dc.identifier.conferencelocationHoliday Inn Atrium, Singapore-
dc.contributor.localauthorLee, Soon-Bok-
dc.contributor.nonIdAuthorBaek, D.C.-
dc.contributor.nonIdAuthorKim, H.H.-
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ME-Conference Papers(학술회의논문)
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