DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Soon-Bok | ko |
dc.contributor.author | Baek, D.C. | ko |
dc.contributor.author | Kim, H.H. | ko |
dc.date.accessioned | 2015-01-29T05:20:47Z | - |
dc.date.available | 2015-01-29T05:20:47Z | - |
dc.date.created | 2014-12-24 | - |
dc.date.created | 2014-12-24 | - |
dc.date.issued | 2014-11-17 | - |
dc.identifier.citation | International Conference on Experimental Mechanics 2014 | - |
dc.identifier.uri | http://hdl.handle.net/10203/193365 | - |
dc.language | English | - |
dc.publisher | International Conference on Experimental Mechanics 2014 | - |
dc.title | Temperature aspect of degradation of electrochemical double-layer capacitors (EDLC) | - |
dc.type | Conference | - |
dc.identifier.wosid | 000353122200026 | - |
dc.identifier.scopusid | 2-s2.0-84924943129 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | International Conference on Experimental Mechanics 2014 | - |
dc.identifier.conferencecountry | SI | - |
dc.identifier.conferencelocation | Holiday Inn Atrium, Singapore | - |
dc.contributor.localauthor | Lee, Soon-Bok | - |
dc.contributor.nonIdAuthor | Baek, D.C. | - |
dc.contributor.nonIdAuthor | Kim, H.H. | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.