(Poster) Determination of carrier escape efficiency in GaN-based light-emitting diodes: a comparison of open- and short-circuit photoluminescence
- Publisher
- ICMOVPE 2014
- Issue Date
- 2014-07-17
- Language
- English
- Citation
17th International conference on metalorganic vapor phase epitaxy(ICMOVPE 2014)
- Appears in Collection
- PH-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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