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College of Engineering(공과대학)School of Mechanical and Aerospace Engineering(기계항공공학부)Dept. of Mechanical Engineering(기계공학과)ME-Conference Papers(학술회의논문)

Measurement of point-spread function (PSF) for confocal fluorescence microscopy

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dc.contributor.authorSong I.-
dc.contributor.authorYoo H.-
dc.contributor.authorChoo J.-
dc.contributor.authorGweon, Dae-Gab-
dc.date.accessioned2010-09-03-
dc.date.available2010-09-03-
dc.date.created2012-02-06-
dc.date.issued2005-08-02-
dc.identifier.citationAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, v.5878, no., pp.1 - 9-
dc.identifier.urihttp://hdl.handle.net/10203/19161-
dc.languageENG-
dc.language.isoen_USen
dc.titleMeasurement of point-spread function (PSF) for confocal fluorescence microscopy-
dc.typeConference-
dc.identifier.scopusid2-s2.0-29244443456-
dc.type.rimsCONF-
dc.citation.volume5878-
dc.citation.beginningpage1-
dc.citation.endingpage9-
dc.citation.publicationnameAdvanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II-
dc.identifier.conferencecountryUnited States-
dc.identifier.conferencecountryUnited States-
dc.contributor.localauthorGweon, Dae-Gab-
dc.contributor.nonIdAuthorSong I.-
dc.contributor.nonIdAuthorYoo H.-
dc.contributor.nonIdAuthorChoo J.-
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ME-Conference Papers(학술회의논문)
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