Temperature measurement of Joule heated silicon microwire by selective coating of quantum dots

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dc.contributor.authorYun, Jeonghoon-
dc.contributor.authorAhn, Jae-Hyuk-
dc.contributor.author이봉재-
dc.contributor.author박인규-
dc.date.accessioned2014-12-08T08:23:31Z-
dc.date.available2014-12-08T08:23:31Z-
dc.date.created2014-10-05-
dc.date.issued2014-07-
dc.identifier.citationNANO KOREA 2014, v., no., pp. --
dc.identifier.urihttp://hdl.handle.net/10203/191448-
dc.languageENG-
dc.publisherNANO KOREA 2014-
dc.titleTemperature measurement of Joule heated silicon microwire by selective coating of quantum dots-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationnameNANO KOREA 2014-
dc.identifier.conferencecountrySouth Korea-
dc.contributor.localauthorYun, Jeonghoon-
dc.contributor.localauthor이봉재-
dc.contributor.localauthor박인규-
dc.contributor.nonIdAuthorAhn, Jae-Hyuk-
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ME-Conference Papers(학술회의논문)
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