DC Field | Value | Language |
---|---|---|
dc.contributor.author | Gweon, Dae-Gab | - |
dc.contributor.author | Sunglim Park | - |
dc.date.accessioned | 2010-09-02 | - |
dc.date.available | 2010-09-02 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2004-11-03 | - |
dc.identifier.citation | 2nd International Symposium on Nano-manufacturing, v., no., pp.555 - 560 | - |
dc.identifier.uri | http://hdl.handle.net/10203/19125 | - |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.title | Optimal Calibration for Rotating Analyzer Ellipsometer | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 555 | - |
dc.citation.endingpage | 560 | - |
dc.citation.publicationname | 2nd International Symposium on Nano-manufacturing | - |
dc.identifier.conferencecountry | South Korea | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Gweon, Dae-Gab | - |
dc.contributor.nonIdAuthor | Sunglim Park | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.