Electrical Characterization of Nanoscale Au/TiO2 Schottky Diodes Probed with Conductive Atomic Force Microscopy
- Publisher
- 한국진공학회
- Issue Date
- 2013-08-23
- Language
- KOR
- Citation
한국진공학회 제 45회 하계학술대회
- Appears in Collection
- EEW-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
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