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Showing results 1 to 4 of 4

1
Data analysis scheme for correcting general misalignments of an optics configuration for a voltage measurement system based on the Pockels electro-optic effect

Choi, Seongmin; Lee, Dong-Geun; Woo, H. J.; Hong, S. H.; Ham, Seunggi; Ryu, Jonghyeon; Chung, Kyoung-Jae; et al, REVIEW OF SCIENTIFIC INSTRUMENTS, v.92, no.4, 2021-04

2
Development of the optic based voltage and current measurement for the X-pinch system = 광학 기반의 X-pinch 시스템 전압, 전류 진단계의 개발link

Choi, Seongmin, 한국과학기술원, 2022

3
Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect

Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11

4
Polar-coordinate-based data analysis scheme for high-voltage measurement system using the Pockels electro-optic effect

Choi, Seongmin; Sugianto, Alvin; Lee, Dong-geun; Woo, HJ; Hong, SH; Ghim, Young-chul, Laser Aided Plasma Diagnostics, Laser Aided Plasma Diagnostics, 2019-09-24

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