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Showing results 1 to 6 of 6

1
An innovative method to reduce count loss from pulse pile-up in a photon-counting pixel for high flux X-ray applications

Lee, D.; Lim, Kyung Taek; Park, K.; Lee, C.; Alexander, S.; Cho, Gyuseong, JOURNAL OF INSTRUMENTATION, v.12, 2017-03

2
Development of a 55 mu m pitch 8 inch CMOS image sensor for the high resolution NDT application

Kim, Myung Soo; Kim, Giyoon; Cho, Gyuseong; Kim, Donggeun, JOURNAL OF INSTRUMENTATION, v.11, 2016-11

3
Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image

Bong, Seungmin; Lee, Dong-Geun; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Lee, Jongmin; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11

4
Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect

Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11

5
Photodiode area effect on performance of X-ray CMOS active pixel sensors

Kim, Myung Soo; Kim, Y.; Kim, G.; Lim, Kyung Taek; Cho, Gyuseong; Kim, Dongeun, JOURNAL OF INSTRUMENTATION, v.13, no.2, 2018-02

6
Results and performances of X-ray imaging GEM cameras on FTU (1-D), KSTAR (2-D) and progresses of future experimental set up on W7-X and EAST Facilities

Cordella, F.; Choe, Wonho; Claps, G.; Gabellieri, L.; Jang, J.; Jeon, Taemin; Lee, S. H.; et al, JOURNAL OF INSTRUMENTATION, v.12, pp.C10006, 2017-10

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