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Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image Bong, Seungmin; Lee, Dong-Geun; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Lee, Jongmin; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
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