Showing results 4 to 6 of 6
Estimation of plasma parameters of X-pinch with time-resolved x-ray spectroscopy Ham, Seunggi; Ryu, Jonghyeon; Lee, Hakmin; Park, Sungbin; Ghim, Young-Chul; Hwang, YS; Chung, Kyoung-Jae, MATTER AND RADIATION AT EXTREMES, v.8, no.3, 2023-05 |
Interferogram analysis of X-pinch plasmas with a synthetic dark-field Schlieren image Bong, Seungmin; Lee, Dong-Geun; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Lee, Jongmin; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
Measurement of the voltage evolution on a load of X-pinch plasma system using the Pockels effect Choi, Seongmin; Ham, Seunggi; Ryu, Jonghyeon; Park, Sungbin; Kim, Jung-Hwa; Choi, YeongHwan; Chung, Kyoung-Jae; et al, JOURNAL OF INSTRUMENTATION, v.18, no.11, 2023-11 |
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