A TiO2-Coated Reflective Layer Enhances the Sensitivity of a CsI:TI Scintillator for X-ray Imaging Sensors

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Columnar-structured cesium iodide (CsI) scintillators doped with thallium (Tl) are frequently used as x-ray converters in medical and industrial imaging. In this study we investigated the imaging characteristics of CsI:T1 films with various reflective layers aluminum (Al), chromium (Cr), and titanium dioxide (TiO2) powder coated on glass substrates. We used two effusion-cell sources in a thermal evaporator system to fabricate CsI:T1 films on substrates. The scintillators were observed via scanning electron microscopy (SEM), and scintillation characteristics were evaluated on the basis of the emission spectrum, light output, light response to x-ray dose, modulation transfer function (MTF), and x-ray images. Compared to control films without a reflective layer, CsI:T1 films with reflective layers showed better sensitivity and light collection efficiency, and the film with a TiO2 reflective layer showed the best properties.
Publisher
OPTICAL SOC KOREA
Issue Date
2014-06
Language
English
Article Type
Article
Keywords

SPATIAL-RESOLUTION; DETECTORS; PERFORMANCE; EFFICIENCY; SYSTEMS; DEVICE; MTF

Citation

JOURNAL OF THE OPTICAL SOCIETY OF KOREA, v.18, no.3, pp.256 - 260

ISSN
1226-4776
DOI
10.3807/JOSK.2014.18.3.256
URI
http://hdl.handle.net/10203/189875
Appears in Collection
NE-Journal Papers(저널논문)
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