Built-In Binary Code Inversion Technique for On-Chip Flash Memory Sense Amplifier With Reduced Read Current Consumption

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dc.contributor.authorPark, Daejinko
dc.contributor.authorKim, Tag-Gonko
dc.date.accessioned2014-09-01T08:15:05Z-
dc.date.available2014-09-01T08:15:05Z-
dc.date.created2014-07-17-
dc.date.created2014-07-17-
dc.date.issued2014-05-
dc.identifier.citationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.22, no.5, pp.1187 - 1191-
dc.identifier.issn1063-8210-
dc.identifier.urihttp://hdl.handle.net/10203/189426-
dc.description.abstractThe bit-line sense amplifier (S/A) for on-chip flash memory compares cell current with reference current to identify data that are programmed. The S/A for 0 (erased) cell data consumes a large sink current, which is greater than off-current for 1 (programmed) cell data. This brief proposes a built-in write/read path based on binary inversion methods to reduce the sensing current of S/A. An original binary code is programmed into flash memory with an inverted binary code based on the proposed bit inversion techniques. The de-inversion hardware, which is implemented with small logic gates to restore original binary data, only consumes logic current instead of analog sink current in the S/A. The proposed techniques are evaluated for the DSPStone benchmark and are applied to the modified S/A for ARM Cortex-M3-based microcontroller with 128-kB on-chip flash memory based on a 0.18-um EEPROM technology. The circuit-level simulation result for the DSPStone benchmark shows that a newly implemented chip with the S/A based on the proposed technique consumes approximately less than 22% of the operating power that conventional S/A uses.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleBuilt-In Binary Code Inversion Technique for On-Chip Flash Memory Sense Amplifier With Reduced Read Current Consumption-
dc.typeArticle-
dc.identifier.wosid000337159500024-
dc.identifier.scopusid2-s2.0-84899985342-
dc.type.rimsART-
dc.citation.volume22-
dc.citation.issue5-
dc.citation.beginningpage1187-
dc.citation.endingpage1191-
dc.citation.publicationnameIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS-
dc.identifier.doi10.1109/TVLSI.2013.2265894-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorKim, Tag-Gon-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorBit-line sense amplifier-
dc.subject.keywordAuthordata-pattern-dependent sensing-
dc.subject.keywordAuthorflash memory-
dc.subject.keywordAuthorlow dynamic power-
dc.subject.keywordAuthorread-path-
dc.subject.keywordAuthorsense circuit-
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