DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Daejin | ko |
dc.contributor.author | Kim, Tag-Gon | ko |
dc.date.accessioned | 2014-08-28T05:05:39Z | - |
dc.date.available | 2014-08-28T05:05:39Z | - |
dc.date.created | 2014-06-25 | - |
dc.date.created | 2014-06-25 | - |
dc.date.created | 2014-06-25 | - |
dc.date.issued | 2013-09-10 | - |
dc.identifier.citation | The 3rd IEEE International Conference on Consumer Electronics | - |
dc.identifier.uri | http://hdl.handle.net/10203/187878 | - |
dc.language | English | - |
dc.publisher | IEEE | - |
dc.title | Safe memory read-path using silent CRC calculation of binary bit-inversion for low-power fast ROM integrity verifcation | - |
dc.type | Conference | - |
dc.identifier.wosid | 000331083000017 | - |
dc.identifier.scopusid | 2-s2.0-84893580934 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | The 3rd IEEE International Conference on Consumer Electronics | - |
dc.identifier.conferencecountry | GE | - |
dc.identifier.conferencelocation | Berlin | - |
dc.contributor.localauthor | Kim, Tag-Gon | - |
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