DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Yong-Hyun | - |
dc.contributor.author | Lee, Eui Sup | - |
dc.contributor.author | Cho, Sanghee | - |
dc.contributor.author | Kang, Stephen Dongmin | - |
dc.contributor.author | Kim, Wondong | - |
dc.contributor.author | Woo,Sung-Jae | - |
dc.contributor.author | Kong, Ki-Jeong | - |
dc.contributor.author | Kim, Ilyou | - |
dc.contributor.author | Lyeo, Ho-Ki | - |
dc.contributor.author | Kim, Hyeong-Do | - |
dc.contributor.author | Zhang, Tong | - |
dc.contributor.author | Stroscio, Joseph A. | - |
dc.date.accessioned | 2014-08-28T01:10:40Z | - |
dc.date.available | 2014-08-28T01:10:40Z | - |
dc.date.created | 2014-03-19 | - |
dc.date.issued | 2014-02-07 | - |
dc.identifier.citation | 제 10회 표면나노과학 워크샵, v., no., pp. - | - |
dc.identifier.uri | http://hdl.handle.net/10203/187537 | - |
dc.language | KOR | - |
dc.publisher | 원자제어 저차원 전자계 연구단 | - |
dc.title | Scanning Thermoelectric Microscopywith Atomic Resolution: SeebeckEffect at the Atomic Scale | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 제 10회 표면나노과학 워크샵 | - |
dc.identifier.conferencecountry | South Korea | - |
dc.contributor.localauthor | Kim, Yong-Hyun | - |
dc.contributor.localauthor | Lee, Eui Sup | - |
dc.contributor.nonIdAuthor | Cho, Sanghee | - |
dc.contributor.nonIdAuthor | Kang, Stephen Dongmin | - |
dc.contributor.nonIdAuthor | Kim, Wondong | - |
dc.contributor.nonIdAuthor | Woo,Sung-Jae | - |
dc.contributor.nonIdAuthor | Kong, Ki-Jeong | - |
dc.contributor.nonIdAuthor | Kim, Ilyou | - |
dc.contributor.nonIdAuthor | Lyeo, Ho-Ki | - |
dc.contributor.nonIdAuthor | Kim, Hyeong-Do | - |
dc.contributor.nonIdAuthor | Zhang, Tong | - |
dc.contributor.nonIdAuthor | Stroscio, Joseph A. | - |
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