NEGF Approach to Surface-Roughness-Limited Mean Free Path in Silicon Nanowire FETs
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hyo-Eun Jung | - |
| dc.contributor.author | Shin, Mincheol | - |
| dc.date.accessioned | 2013-12-06T01:04:11Z | - |
| dc.date.available | 2013-12-06T01:04:11Z | - |
| dc.date.created | 2013-10-11 | - |
| dc.date.issued | 2013-10-07 | - |
| dc.identifier.citation | IEEE Nanotechnology Materials and Devices Conference 2013, v., no., pp. - | - |
| dc.identifier.uri | http://hdl.handle.net/10203/182630 | - |
| dc.language | ENG | - |
| dc.publisher | NMDC | - |
| dc.title | NEGF Approach to Surface-Roughness-Limited Mean Free Path in Silicon Nanowire FETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.publicationname | IEEE Nanotechnology Materials and Devices Conference 2013 | - |
| dc.identifier.conferencecountry | Taiwan, Province of China | - |
| dc.contributor.localauthor | Shin, Mincheol | - |
| dc.contributor.nonIdAuthor | Hyo-Eun Jung | - |
- Appears in Collection
- EE-Conference Papers(학술회의논문)
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