기상유도결정화법과 급속열처리를 이용한 다결정 Si 박막에서의 Ni 금속 오염량 감소 및 다결정 Si 박막 트랜지스터 특성에 관한 연구Control of Ni contamination in polycrystalline Si films by vapor-induced crystallization and rapid thermal annealing process and characterization of polycrystalline Si thin film transistors

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Advisors
안병태researcherAhn, Byung-Tae
Description
한국과학기술원 : 신소재공학과,
Publisher
한국과학기술원
Issue Date
2013
Identifier
515083/325007  / 020113152
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2013.2, [ vii, 80 p. ]

Keywords

기상유도결정화; 급속열처리; vapor induced crystallization; rapid thermal annealing; thin film transistor; 박막 트랜지스터

URI
http://hdl.handle.net/10203/181996
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=515083&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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