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Microstructural characterization at the interface of Al2O3/ZnO/Al2O3 thin films grown by atomic layer deposition Jang, Yong-Woon; Bang, Seok-Hwan; Jeon, Hyeong-Tag; Lee, Jeong-Yong, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.248, no.7, pp.1634 - 1638, 2011-07 |
Role of postannealing temperature on the microstructure of Al2O3/ZnO thin films grown by atomic layer deposition for TFT applications Jang, Yong-Woon; Bang, Seok-Hwan; Jeon, Hyeong-Tag; Lee, Jeong-Yong, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.207, no.9, pp.2185 - 2189, 2010-09 |
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