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Enhancement of electrical properties of Pt/SrBi2Nb2O9/Pt structures by remote oxygen plasma annealing Kim, IS; Kim, YM; Choi, IH; Kim, SI; Kim, YH; Yoo, DC; Lee, JeongYong; et al, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.1275 - 1278, 2004-11 |
Improvement of electrical properties of ferroelectric gate oxide structure by using Al2O3 thin films as buffer insulator Choi, HS; Lim, GS; Lee, JH; Kim, YT; Kim, SI; Yoo, DC; Lee, JeongYong; et al, THIN SOLID FILMS, v.444, no.1-2, pp.276 - 281, 2003-11 |
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