Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject FIELD-ION MICROSCOPE

Showing results 1 to 2 of 2

1
Evaluation of Analysis Conditions for Laser-Pulsed Atom Probe Tomography: Example of Cemented Tungsten Carbide

Peng, Zirong; Choi, Pyuck-Pa; Gault, Baptiste; Raabe, Dierk, MICROSCOPY AND MICROANALYSIS, v.23, no.2, pp.431 - 442, 2017-04

2
Mining information from atom probe data

Cairney, Julie M.; Rajan, Krishna; Haley, Daniel; Gault, Baptiste; Bagot, Paul A.J.; Choi, Pyuck-Pa; Felfer, Peter J.; et al, ULTRAMICROSCOPY, v.159, pp.324 - 337, 2015-12

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