Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject FIB
Showing results 1 to 3 of 3
| Application of focused ion beam to atom probe tomography specimen preparation from mechanically alloyed powders Choi, Pyuck-Pa; Al-Kassab, Tala'at; Kwon, Young-Soon; Kim, Ji-Soon; Kirchheim, Reiner, MICROSCOPY AND MICROANALYSIS, v.13, no.5, pp.347 - 353, 2007-10 |
| Atom probe tomography characterization of heavily cold drawn pearlitic steel wire Li, Y. J.; Choi, Pyuck-Pa; Borchers, C.; Chen, Y. Z.; Goto, S.; Raabe, D.; Kirchheim, R., ULTRAMICROSCOPY, v.111, no.6, pp.628 - 632, 2011-05 |
| Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique Choi, Pyuck-Pa; Kwon, Young-Soon; Kim, Ji-Soon; Al-Kassab, Tala'at, JOURNAL OF ELECTRON MICROSCOPY, v.56, no.2, pp.43 - 49, 2007-04 |
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