Showing results 1 to 1 of 1
Impact of amorphous titanium oxide film on the device stability of Al/TiO2/Al resistive memory Jeong, Hu Young; Kim, Sung Kyu; Lee, JeongYong; Choi, Sung-Yool, APPLIED PHYSICS A-MATERIALS SCIENCE PROCESSING, v.102, pp.967 - 972, 2011-03 |
Discover