Browse "Dept. of Materials Science and Engineering(신소재공학과)" by Subject microwave

Showing results 1 to 9 of 9

1
Dielectric properties of Mn-doped BST thin films for microwave application

Kim, RY; Kim, HS; Lim, MH; Kim, Ho Gi; Kim, Il-Doo, INTEGRATED FERROELECTRICS, v.66, pp.195 - 195, 2004

2
Effect of microstructure on dielectric properties of Si3N4 at microwave frequency

Park, MK; Kim, HN; Lee, KS; Baek, SS; Kang, ES; Baek, YK; Kim, Do Kyung, ADVANCED SI-BASED CERAMICS AND COMPOSITES BOOK SERIES: KEY ENGINEERING MATERIALS, v.287, pp.247 - 252, 2005

3
Fabrication and characterization of BaxSr1-xTiO3/YBa(2)Cu3O(x)/SrTiO3 structure

Choi, J; Kim, E; Park, SY; Lee, JS; Sung, TH; Park, Y; No, Kwangsoo, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.9, pp.5567 - 5571, 2002-09

4
Frequency and voltage dependent dielectric properties of Ni-doped Ba0.6Sr0.4TiO3 thin films

Ryu, HC; Lee, SJ; Lim, MH; Kim, HS; Kim, NY; Kim, Ho Gi; Kim, Il-Doo; et al, JOURNAL OF ELECTROCERAMICS, v.13, pp.239 - 243, 2004-07

5
Influence of narrow transverse slit in ferroelectric based voltage tunable phase shifter

Kim, Il-Doo; Park, Jeong-Ho; Lim, Mi-Hwa; Kim, Myung-Sun; Kim, Ho-Gi; Yoon, Soon-Gil; Kim, Ki-Byoung; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.41, no.11B, pp.7218 - 7221, 2002-11

6
Microwave dielectric properties of ferroelectric BaTiO3 thin film

Cho, YW; Hyun, TS; Choi, Si-Kyung, JOURNAL OF ELECTROCERAMICS, v.13, no.1-3, pp.251 - 255, 2004-07

7
Microwave-induced low-temperature crystallization of amorphous Si thin films

Ahn, JH; Lee, JN; Kim, YC; Ahn, Byung Tae, CURRENT APPLIED PHYSICS, v.2, pp.135 - 139, 2002

8
$NiCl_2$ 및 마이크로웨이브 가열을 이용한 비정질 Si 박막의 저온결정화에 관한 연구 = Low temperature crystallization amorphous Si thin films using $NiCl_2$ and microwave heatinglink

안진형; Ahn, Jin-Hyung; et al, 한국과학기술원, 2002

9
Thin-film transistors fabricated with poly-Si films crystallized at low temperature by microwave annealing

Choi, YW; Lee, JN; Jang, TW; Ahn, Byung Tae, IEEE ELECTRON DEVICE LETTERS, v.20, no.1, pp.2 - 4, 1999-01

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